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Dft Design For Test Engineer

  • Job type Posted on: Jul 24, 2026
  • Experience level Northern Base
  • Employment type Santa Clara, California
  • Employment type Onsite
  • Salary Full-time

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Job Title :

Dft Design For Test Engineer

Job Type :

Full-time

Job Location :

Santa Clara California United States

Remote :

No

Jobcon Logo Job Description :

DFT (Design for Test) Engineer

Location: Santa Clara, CA
Experience: 3 11 Years
Employment Type: Contract
U.S. Citizens and Green Card holders are preferred.


Key Skills & Experience

  • Hands-on experience with the Siemens Tessent (Mentor Graphics) DFT tool suite.
  • Strong understanding of DFT fundamentals, including controllability, observability, scan insertion, and scan-based testing.
  • Expertise in ATPG (Automatic Test Pattern Generation), including pattern generation, analysis, debugging, and fault coverage improvement.
  • Experience with MBIST (Memory Built-In Self-Test), including memory test architecture, implementation, and diagnostics.
  • Good knowledge of IO Test methodologies for interface and pin-level validation.
  • Strong understanding of Clock DFT and clock verification concepts.
  • Solid foundation in Digital Design and RTL (Verilog/SystemVerilog).
  • Experience with industry-standard DFT/ATPG EDA tools.
  • Experience in verification of DFT features, including Boundary Scan (JTAG), IJTAG, MBIST, High-Speed Scan Testing, and other DFT methodologies.
  • Excellent analytical, debugging, and problem-solving skills.

Jobcon Logo Position Details

Posted:

Jul 24, 2026

Reference Number:

1427-42103

Employment:

Full-time

Salary:

Not Available

City:

Santa Clara

Job Origin:

CIEPAL_ORGANIC_FEED

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DFT (Design for Test) Engineer

Location: Santa Clara, CA
Experience: 3 11 Years
Employment Type: Contract
U.S. Citizens and Green Card holders are preferred.


Key Skills & Experience

  • Hands-on experience with the Siemens Tessent (Mentor Graphics) DFT tool suite.
  • Strong understanding of DFT fundamentals, including controllability, observability, scan insertion, and scan-based testing.
  • Expertise in ATPG (Automatic Test Pattern Generation), including pattern generation, analysis, debugging, and fault coverage improvement.
  • Experience with MBIST (Memory Built-In Self-Test), including memory test architecture, implementation, and diagnostics.
  • Good knowledge of IO Test methodologies for interface and pin-level validation.
  • Strong understanding of Clock DFT and clock verification concepts.
  • Solid foundation in Digital Design and RTL (Verilog/SystemVerilog).
  • Experience with industry-standard DFT/ATPG EDA tools.
  • Experience in verification of DFT features, including Boundary Scan (JTAG), IJTAG, MBIST, High-Speed Scan Testing, and other DFT methodologies.
  • Excellent analytical, debugging, and problem-solving skills.

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